The goal of this course is to provide the student with a basic understanding of a set of microscopic, spectroscopic and diffraction techniques, particularly suited for nanoscience and condensed matter physics. Some of the different techniques to be explored include:
--scanning tunneling microscopy (STM)
--atomic force microscopy (AFM)
--transmission electron microscopy (TEM)
--scanning electron microscopy (SEM)
--electron energy loss spectroscopy (EELS)
--X-ray diffraction
--X-ray absorption
--angle-resolved photoemission spectroscopy (ARPES)
--X-ray magnetic circular dichroism (XMCD)
- Enseignant: Julien Barjon
- Enseignant: Elizabeth Boer-Duchemin
- Enseignant: Emmanouil Frantzeskakis
- Enseignant: Claire Laulhe
- Enseignant: Maxime Vallet
- Enseignant: Alberto Zobelli
Année: 21/22